Low-Refractive-Index Nanoporous Silica Improves Reflectivity of Dielectric Mirror
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چکیده
منابع مشابه
Control capability of electrolytic concentration on refractive index and dielectric constant of porous Silicon layers
Porous Silicon (PS) samples have been prepared by electrochemical anodization of p-type silicon wafer by varying HF concentrations in the electrolytic solution. The structural, surface morphological, optical and surface composition analysis of the prepared samples were done by X-ray diffraction (XRD), Scanning electron microscopy (SEM), Photoluminescence (PL) and Fourier transform infr...
متن کاملControl capability of electrolytic concentration on refractive index and dielectric constant of porous Silicon layers
Porous Silicon (PS) samples have been prepared by electrochemical anodization of p-type silicon wafer by varying HF concentrations in the electrolytic solution. The structural, surface morphological, optical and surface composition analysis of the prepared samples were done by X-ray diffraction (XRD), Scanning electron microscopy (SEM), Photoluminescence (PL) and Fourier transform infr...
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Nowadays, nanoporous films are widely employed in biochemical applications or in optophotonic devices such as displays, solar cells, or light-guiding systems. In particular, the technological feasibility of nanoporous layers with low refractive indices has recently enabled the development of high-efficiency anti-reflection coatings. In this paper, we report on hybrid polymer nanoporous films th...
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ژورنال
عنوان ژورنال: MRS Bulletin
سال: 2005
ISSN: 0883-7694,1938-1425
DOI: 10.1557/mrs2005.170